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  • L. Li, N. Vijaykrishnan, M. Kandemir, M. J. Irwin, Adaptive Error Protection for Energy Efficiency, Proc. of ICCAD’03, pp. 2-7, Nov. 2003.
  • W. Zhang, M. Kandemir, A. Sivasubramaniam, M. J. Irwin, Performance, Energy, and Reliability Tradeoffs in Replicating Hot Cache Lines, Proc. of CASES'03, pp. 309-317, Oct 2003.
  • R. Ramanarayanan, V. Degalahal, N. Vijaykrishnan, M. J. Irwin, D. Duarte, Analysis of Soft Error Rate in Flip-Flops and Scannable Latches, Proc. of ASIC/SOC’03, pp. 231-234, Sep. 2003.
  • B. Kang, N. Vijaykrishnan, M. J. Irwin, D. Duarte, Substrate Noise Detector for Noise Tolerant Mixed-Signal IC, Proc. of ASIC/SOC’03, pp. 279-282, Sep. 2003.
  • V. Degalahal, N. Vijaykrishnan, M. J. Irwin, Soft Error Susceptibility of Low Power SRAM Designs, Proc. of. VLSI Design, pp. 539-545, Jan. 2003.

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